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> Mar 08 2012

IMAPS journée technique: Fiabilité des composants et systèmes

IMAPS Technical Exhibition day Journée...

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Dynamic Infrared Thermography
Topography and Deformation Measurement - TDM

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Yxlon - FeinFocus

Imaginant - JSR

High Resolution NDT

Scanning Acoustic Microscopy - SAM

2D X-ray Radiography

3D X-ray Computed Tomography

X-ray Microfluorescence

Dynamic Infrared Thermography

Topography and Deformation Measurement - TDM