Nano- & Micro- focus X-ray Systems

Nikon Metrology 2D and 3D X-Ray inspection systems meet the widest variety of application: electronics, automotive, medical, jewelry, contacts, plastics, and so on.

  • Minimum detail size: 500 nm
  • Samples from 500µm to 500mm side length
  • Radiography systems with tomography as an option
  • Micro-focus and nano-focus X-ray tube
  • Advantages : easy program set-up for fast production control, automatic void calculation (solder joint, BGA, thermal pad, die-attach, etc), image processing, easy to set-up laminography

 

You will find below the description of Nikon Metrology X-ray imaging products, from basic XTV130 to XTV 160 with optional tomography, and also accurate systems XTH 225-350-450 (kV, with micro-focus spots). Laboratory equipment add-on are available to complement our offer: digital microscopes, benchtop SEM, etc

After equipment integration in your facility, Insidix supports you for maintenance as well as training or application development.

Feel free to contact us for more information

 

XTV 130C

 

The XT V 130C is a highly flexible and cost-effective electronics and semiconductor inspection system. The system features a 130kV / 10 watt  Nikon Metrology manufactured source, a globally recognized open tube design with integrated generator, and a high-resolution imaging chain.

Through a series of factory and field upgrades, the end-user can configure these systems to its own needs with a higher power source, a rotating sample tray, automatic inspection software, a digital flat panel option, and the ability to add future-proof CT technology.

XTV 160

The XTV 160 is specifically designed for use in production lines and failure analysis laboratories. With a precision joystick, system users control the 5-axis sample manipulator. Real-time X-ray allows them to intuitively navigate complex printed circuit boards and electronic components and quickly trace defects. In automated inspection mode, samples can be inspected at highest throughput.

 

160kV-20W tube, tomography, laminography, inspection program